New method of measuring the permittivity of silicon wafer, with relevance to permittivity-based quality sensing
Author:
Publisher
Elsevier BV
Subject
Condensed Matter Physics,General Materials Science
Reference22 articles.
1. Effect of intrinsic and extrinsic defects on the structural, thermal, and electrical properties in p-Type CZ-Si wafers with different carrier concentrations;Martinez-Hernandez;Int. J. Thermophys.,2022
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3. Characterisation of striations in n-type silicon wafer processed with polysilicon contacts;Zhou;Sol. Energy Mater. Sol. Cells,2022
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1. Bipolar charge transport and contact phenomena in Al2O3;Thin Solid Films;2023-09
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