Automatic Full Strain Field Moiré Interferometry Measurement with Nano-scale Resolution-Reference-Cited by-同舟云学术

Automatic Full Strain Field Moiré Interferometry Measurement with Nano-scale Resolution

Published:2008-04-01 Issue:5 Volume:48 Page:665-673
ISSN:0014-4851
Container-title:Experimental Mechanics
language:en
Short-container-title:Exp Mech

Author:

Chen B.,Basaran C.

Publisher

Springer Science and Business Media LLC

Subject

Mechanical Engineering,Mechanics of Materials,Aerospace Engineering

Link

http://link.springer.com/content/pdf/10.1007/s11340-008-9127-3.pdf

Reference26 articles.

1. Post D, Han B, Ifju P (1994) High sensitivity moiré: experimental analysis for mechanics and materials. Springer, New York.

2. Han B (1998) Recent advancements of moiré and microscopic moiré interferometry for thermal deformation analyses of microelectronics devices. Exp Mech 38:278–288.

3. Morita Y, Arakawa K, Todo M (2007) High-sensitivity measurement of thermal deformation in a stacked multichip package. IEEE Trans Compon Packag Technol 30:137–143.

4. Han B, Kunthong P (2000) Micro-mechanical deformation analysis of surface laminar circuit in organic flip-chip package: an experimental study. Transactions of the ASME. J Electron Packag 122:294–300.

5. Guo Y, Lim CK, Chen WT, Woychik CG (1993) Solder ball connect (SBC) assemblies under thermal loading. I. Deformation measurement via moiré interferometry, and its interpretation. IBM J Res Develop 37:635–647.

Cited by 17 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Deformation tracking of truss lattices under dynamic loading based on Digital Image Correlation;Mechanics of Materials;2023-08

2. Accurate measurement of elastic modulus of specimen with initial bending using two-dimensional DIC and dual-reflector imaging technique;Measurement;2018-04

3. Parameter estimation of optical fringes with quadratic phase using the fractional Fourier transform;Optics and Lasers in Engineering;2015-11

4. Out-of-plane displacement field measurement by shearography;Optics & Laser Technology;2015-10