A Novel Technique for the Determination of Surface Biaxial Stress under External Confinement Using Raman Spectroscopy
Author:
Publisher
Springer Science and Business Media LLC
Subject
Mechanical Engineering,Mechanics of Materials,Aerospace Engineering
Link
http://link.springer.com/content/pdf/10.1007/s11340-014-9851-9.pdf
Reference55 articles.
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3. Ghosh D, Subhash G, Orlovskaya N (2008) Measurement of scratch-induced residual stress within SiC grains in ZrB2–SiC composite using micro-Raman spectroscopy. Acta Mater 56:5345–5354
4. Martín E, Jiménez J, Chafai M (1998) MicroRaman study of crystallographic defects in SiC crystals. Solid-State Electron 42:2309–2314
5. Kang Y, Qiu Y, Lei Z, Hu M (2005) An application of Raman spectroscopy on the measurement of residual stress in porous silicon. Opt Laser Eng 43:847–855
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