Self-Assembled Nanoparticle Surface Patterning for Improved Digital Image Correlation in a Scanning Electron Microscope
Author:
Publisher
Springer Science and Business Media LLC
Subject
Mechanical Engineering,Mechanics of Materials,Aerospace Engineering
Link
http://link.springer.com/content/pdf/10.1007/s11340-013-9734-5.pdf
Reference32 articles.
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2. Sutton MA, Li N, Garcia D, Cornille N, Orteu JJ, McNeill SR, Schreier HW, Li X, Reynolds AP (2007) Scanning electron microscopy for quantitative small and large deformation measurements part II: experimental validation for magnifications from 200 to 10,000. Exp Mech 47:789–804. doi: 10.1007/s11340-007-9041-0
3. Sutton MA, McNeill SR, Helm JD, Chao YJ (2000) Advances in two-dimensional and three-dimensional computer vision. In: Rastogi P (ed) Photomechanics, Top Appl Phys 77. Springer Berlin, Heidelberg, pp 323–372. doi: 10.1007/3-540-48800-6 , 10
4. Sutton MA, Orteu JJ, Schreier HW (2009) Digital image correlation (DIC). In: Image correlation for shape, motion and deformation measurements. Springer US, p 83. doi: 10.1007/978-0-387-78747-3 5
5. Scrivens WA, Luo Y, Sutton MA, Collette SA, Myrick ML, Miney P, Colavita PE, Reynolds AP, Li X (2007) Development of patterns for digital image correlation measurements at reduced length scales. Exp Mech 47:63–77. doi: 10.1007/s11340-006-5869-y
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