Author:
Walker James Alfred,Hilder James A.,Reid Dave,Asenov Asen,Roy Scott,Millar Campbell,Tyrrell Andy M.
Publisher
Springer Science and Business Media LLC
Subject
Computer Science Applications,Hardware and Architecture,Theoretical Computer Science,Software
Reference46 articles.
1. A. Asenov, Random dopant induced threshold voltage lowering and fluctuations in sub 50 nm MOSFETs: a statistical 3D ’atomistic’ simulation study. Nanotechnology 10, 153–158 (1999)
2. A. Asenov, Variability in the next generation CMOS technologies and impact on design. In Proceedings of the 1st International Conference of CMOS Variability (2007)
3. A. Asenov, S. Kaya, J. Davies, Intrinsic threshold voltage fluctuations in decanano MOSFETs due to local oxide thickness variations. IEEE Trans. Electron Devices 49, 112–119 (2002)
4. J.B. Bernstein, M. Gurfinkela, X. Lia, J. Waltersa, Y. Shapiraa, M. Talmora, Electronic circuit reliability modeling. Microelectron. Reliab. 46(12), 1957–1979 (2006)
5. K. Bernstein, D.J. Frank, A.E. Gattiker, W. Haensch, B.L. Ji, S.R. Nassif, E.J. Nowak, D.J. Pearson, N.J. Rohrer, High-performance CMOS variability in the 65-nm regime and beyond. IBM J. Res. Dev. Adv. Silicon Technol. 50(4/5), 433–449 (2006)
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