Characterization of grain boundary disconnections in SrTiO3 Part II: the influence of superimposed disconnections on image analysis-Reference-Cited by-同舟云学术

Characterization of grain boundary disconnections in SrTiO3 Part II: the influence of superimposed disconnections on image analysis

Published:2018-11-20 Issue:5 Volume:54 Page:3710-3725
ISSN:0022-2461
Container-title:Journal of Materials Science
language:en
Short-container-title:J Mater Sci

Author:

Sternlicht Hadas^ORCID,Rheinheimer Wolfgang^ORCID,Kim Judy^ORCID,Liberti Emanuela^ORCID,Kirkland Angus I.^ORCID,Hoffmann Michael J.^ORCID,Kaplan Wayne D.^ORCID

Funder

German-Israeli Foundation for Scientific Research and Development

FP7 Ideas: European Research Council

Engineering and Physical Sciences Research Council

Publisher

Springer Science and Business Media LLC

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Link

http://link.springer.com/article/10.1007/s10853-018-3095-5/fulltext.html

Reference32 articles.

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4. Houben L (2006) Aberration-corrected HRTEM of defects in strained La2CuO4 thin films grown on SrTiO3. J Mater Sci 41:4413–4419. https://doi.org/10.1007/s10853-006-0151-3

5. Kirkland AI, Meyer RR (2004) “Indirect” high-resolution transmission electron microscopy: aberration measurement and wavefunction reconstruction. Microsc Microanal 10:401–413. https://doi.org/10.1017/S1431927604040437

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