Study of diffusion of impurities in semiconductor silicon by activation analysis and nuclear reaction methods

Author:

Kotas P.,Obrusnik I.,Kvitek J.,Hnatowicz V.

Publisher

Springer Science and Business Media LLC

Subject

Health, Toxicology and Mutagenesis,Public Health, Environmental and Occupational Health,Spectroscopy,Pollution,Radiology, Nuclear Medicine and imaging,Nuclear Energy and Engineering,Analytical Chemistry

Reference21 articles.

1. S. MAEKAWA, J. Phys. Soc. Japan, 17 (1962) 1592.

2. R. GERETH, G. H. SCHWULTKE, Appl. Phys. Letters, 8 (1966) 55.

3. C. F. GIBBONS, Proc. Symp. Silicon Device Processing, CH. P. MARDSEN (Ed.), Maryland, 1970, p. 21.

4. L. E. KATZ, Proc. Symp. Silicon Device Processing, CH. P. MARDSEN, (Ed.) Maryland, 1970, p. 192.

5. J. C. IRWIN, Proc. Symp Silicon Device Processing, CH. P. MARDSEN, (Ed.), Maryland, 1970, p. 99.

Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. A new neutron depth profiling spectrometer at the JCNS for a focused neutron beam;Radiation Effects and Defects in Solids;2020-03-03

2. Analysis of depth profiles of 10B and 6Li in Si wafers and lithium ion battery electrodes using the KAERI-NDP system;Journal of Radioanalytical and Nuclear Chemistry;2015-12-08

3. Neutron depth profiling: Overview and description of NIST facilities;Journal of Research of the National Institute of Standards and Technology;1993-01

4. Chapter 7 Application of neutron activation analysis to silicon characterization;Progress in Crystal Growth and Characterization;1984-01

5. The radioanalytical bibliography of Czechoslovakia (1936–1977);Journal of Radioanalytical Chemistry;1982-09

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3