Scanning probe microscope with interchangeable AFM-FFM and STM heads

Author:

Allegrini M.,Arpa E.,Ascoli C.,Baschieri P.,Dinelli F.,Frediani C.,Labardi M.,Lio A.,Mariani T.,Vanni L.

Publisher

Springer Science and Business Media LLC

Subject

General Physics and Astronomy

Reference46 articles.

1. A. Aviram (Editor):Molecular Electronics-Science and Techonology (Engineering Foundation, 1989).

2. J. R. Barker, P. C. Connolly andG. Moores: inPhysics of Granular Nanoelectronic Systems, edited byD. K. Ferry, J. R. Barker andC. Jacoboni (Plenum Press, 1991).

3. G. Binnig, H. Rohrer, Ch. Gerber andE. Weibel:Phys. Rev. Lett.,49, 57 (1982).

4. G. Binnig, C. F. Quate andCh. Gerber:Phys. Rev. Lett.,56, 930 (1986).

5. T. P. Beebe jr.,T. E. Wilson, D. F. Ogletree, J. E. Katz, R. Balhorn, M. B. Salmeron andW. J. Siekhaus:Science,243, 370 (1989).

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