Nanoscale characterization of resistive switching using advanced conductive atomic force microscopy based setups-Reference-Cited by-同舟云学术

Nanoscale characterization of resistive switching using advanced conductive atomic force microscopy based setups

Published:2017-04-28 Issue:1-4 Volume:39 Page:94-108
ISSN:1385-3449
Container-title:Journal of Electroceramics
language:en
Short-container-title:J Electroceram

Author:

Lanza Mario,Celano Umberto,Miao Feng

Funder

National Natural Science Foundation of China

Ministry of Education of the People's Republic of China

Ministry of Finance

Ministry of Science and Technology of the People's Republic of China

Government of Jiangsu Province

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering,Materials Chemistry,Mechanics of Materials,Condensed Matter Physics,Ceramics and Composites,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/article/10.1007/s10832-017-0082-1/fulltext.html

Reference85 articles.

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4. M. Lanza, Conductive Atomic Force Microscopy: Applications in Nanomaterials, (Wiley-VCH, Weinheim, 2017)

5. M. Lanza, M. Porti, M. Nafría, X. Aymerich, A. Sebastiani, G. Ghidini, A. Vedda, M. Fasoli, IEEE Trans. Device Mater. Reliab. 9, 529 (2009)

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