X-RAY SPECTROSCOPY
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Publisher
Springer Netherlands
Link
http://link.springer.com/content/pdf/10.1007/978-1-4020-5724-3_36.pdf
Reference6 articles.
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3. A. S. Shulakov, V. A. Fomichev, Threshold effects in Ultrasoft X-Ray Emission, Phys. Scr. 41 99–104 (1999)
4. E. O. Filatova, E. Yu. Taracheva, A. A. Sokolov, S. V. Bukin, A. S. Shulakov, P. Jonnard, J.-M. André, V. E. Drozd, Ultrasoft X-ray reflection and emission spectroscopic analysis of Al2O3/Si structure synthesized by ALD method, X-Ray Spectrometry (2006), in press
5. L. G. Parrat, Electronic band structure of solids by X-ray spectroscopy, Rev. Mod. Phys. 31, 616–645 (1959)
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