1. S. U. Kim, “ESD induced gate oxide damage during wafer fabrication process,” EOS/ESD Symposium, pp. 99–105, 1992.
2. R. G. Chemelli, B. A. Unger, and P. R. Bossard, “ESD by static induction,” EOS/ESD Symposium, pp. 29–36, 1983.
3. C. Diaz, S. M. Kang, and C. Duvvury, “Tutorial electrical overstress and electrostatic discharge,” IEEE Trans. on Reliability, vol. 44, No. 1, pp. 2–5, 1995.
4. J. Bernier and G. Groft, “Die level CDM testing duplicates assembly operation failures,” EOS/ESD Symposium, pp. 117–122, 1986.
5. C. Russ, ESD Protection Devices for CMOS Technologies: Processing Impact, Modeling, and Testing Issues, Ph.D. thesis, 1999.