Author:
Su Shyang-Tai,Makki Rafic Z.
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Reference17 articles.
1. G. Watson, ?The 64 M-bit DRAM,? IEEE Spectrum, p. 30, January 1991.
2. R. Nair, S.M. Thatte, and J.A. Abraham, ?Efficient algorithms for testing semiconductor random-access memories,? IEEE Trans. on Comp., vol. C-27, pp. 572?576, June 1978.
3. M.A. Breuer, and A.D. Friedman, Diagnosis and Reliable Design of Digital System, Computer Science Press, Rockville, Maryland, pp. 139?145, 1976.
4. J.R. Brown, ?Pattern sensitivity in MOS memories,? Digest Symp. Testing to Integrate Semiconductor Memories into Computer Mainframes, Cherry Hill, N.J., pp. 33?46, October 1972.
5. J.P. Hayes, ?Detection of pattern-sensitive faults on randomaccess memories,? IEEE Trans. on Comp., vol. C-24, pp. 150?187, February 1975.
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