Testing and Reliability Techniques for High-Bandwidth Embedded RAMs
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Published:2004-02
Issue:1
Volume:20
Page:89-108
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ISSN:0923-8174
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Container-title:Journal of Electronic Testing
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language:en
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Short-container-title:Journal of Electronic Testing
Author:
Chakraborty Kanad
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering