Nanowear pretreatment of AFM tips for reasonable friction force
Author:
Publisher
Springer Science and Business Media LLC
Subject
General Engineering,General Materials Science
Link
http://link.springer.com/content/pdf/10.1007/s11431-014-5629-7.pdf
Reference30 articles.
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4. Ogino T, Nishimura S, Shirakashi J. Sub-20 nm scratch nanolithography for Si using scanning probe microscopy. Jap J Appl Phys, 2007, 10A: 6908–6910
5. Yan Y D, Sun T, Dong S. Study on effects of tip geometry on AFM nanoscratching tests. Wear, 2007, 3–4: 477–483
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