Author:
Sun Chen,Su DongChuan,Li XiDe
Publisher
Springer Science and Business Media LLC
Subject
General Engineering,General Materials Science
Reference25 articles.
1. Davis H E, Troxell G E, Hauck G F W. The Testing of Engineering Materials. In: 4th ed. New York: McGraw-Hill, 1982. 68–178
2. Sharpe W N, Yuan B, Edwards R L. A new technique for measuring the mechanical properties of thin films. J Microelectromech Syst, 1997, 6(3): 193–199
3. Ogawa H, Suzuki K, Kaneko S, et al. Measurements of mechanical properties of microfabricated thin films. Proceedings of the IEEE Micro Electro Mechanical Systems (MEMS), 1997. 430–435
4. Haque M A, Saif M T A. In-situ tensile testing of nano-scale specimens in SEM and TEM. Exp Mech, 2002, 42(1): 123–128
5. Li X, Yang Y, Wei C. In situ and real-time tensile testing of thin films using double-field-of-view electronic speckle pattern interferometry. Meas Sci Technol, 2004, 15(1): 75–83
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献