Author:
Qin JunRui,Chen ShuMing,Liu BiWei,Chen JianJun,Liang Bin,Liu Zheng
Publisher
Springer Science and Business Media LLC
Subject
General Engineering,General Materials Science
Reference16 articles.
1. Shivakumar P, Kistler M, Keckler S W, et al. Modeling the effect of technology trends on the soft error rate of combinational logic. In: Proc Int Conf Dependable Syst Networks, Washington, DC, 2002
2. Uemura T, Tosaka Y, Satoh S. Neutron-induced soft-error simulation technology for logic circuits. Jpn J Appl Phys, 2006, 45(4): 3256–3259
3. Rodbell K P, Heidel D F, Tang H H K, et al. Low-energy proton-induced single-event-upsets in 65 nm node, silicon-on-insulator, latches and memory cells. IEEE Trans Nucl Sci, 2007, 54(6): 2474–2479
4. Baumann R C, Radaelli D. Determination of geometry and absorption effects and their impact on the accuracy of alpha particle soft error rate extrapolations. IEEE Trans Nucl Sci, 2007, 54(6): 2141–2148
5. Roche P, Gasiot G. Impacts of front-end and middle-end process modifications on terrestrial soft error rate. IEEE Trans Dev Mater Reliab, 2005, 5(3): 382–396
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