H-Switch Cover: a new test criterion to generate test case from finite state machines

Author:

Souza Érica Ferreira de,Santiago Júnior Valdivino Alexandre de,Vijaykumar Nandamudi Lankalapalli

Publisher

Springer Science and Business Media LLC

Subject

Safety, Risk, Reliability and Quality,Software

Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Novel Metrics for Mutation Analysis;Computer Systems Science and Engineering;2023

2. A Systematic Literature Review on prioritizing software test cases using Markov chains;Information and Software Technology;2022-07

3. Overview of Test Coverage Criteria for Test Case Generation from Finite State Machines Modelled as Directed Graphs;2022 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW);2022-04

4. Conformance Testing for Finite State Machines Guided by Deep Neural Network;Journal of Circuits, Systems and Computers;2022-02-17

5. An EFSM-Based Test Data Generation Approach in Model-Based Testing;Computers, Materials & Continua;2022

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