A classification and systematic review of product line feature model defects

Author:

Bhushan MeghaORCID,Negi Arun,Samant Piyush,Goel Shivani,Kumar Ajay

Funder

Rajiv Gandhi National Fellowship, UGC

Publisher

Springer Science and Business Media LLC

Subject

Safety, Risk, Reliability and Quality,Software

Cited by 20 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. An ontological knowledge-based method for handling feature model defects due to dead feature;Engineering Applications of Artificial Intelligence;2024-10

2. Speculative computing for AAFM solutions in large-scale product configurations;Scientific Reports;2024-05-16

3. Enhancing Secure Development in Globally Distributed Software Product Lines: A Machine Learning-Powered Framework for Cyber-Resilient Ecosystems;Computers, Materials & Continua;2024

4. Impact of UAVs in Agriculture;Advances in Systems Analysis, Software Engineering, and High Performance Computing;2023-06-30

5. Customer Satisfaction and Retention at Fitness Centres Based on Website Quality and Service;Handbook of Research on AI and Knowledge Engineering for Real-Time Business Intelligence;2023-04-07

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