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Compensation effects at electron traps in semiconductors

Published:2012-10-18 Issue:1 Volume:144 Page:73-82
ISSN:0026-9247
Container-title:Monatshefte für Chemie - Chemical Monthly
language:en
Short-container-title:Monatsh Chem

Author:

Engstrom O.

Publisher

Springer Science and Business Media LLC

Subject

General Chemistry

Link

http://link.springer.com/content/pdf/10.1007/s00706-012-0864-8.pdf

Reference36 articles.

1. Milne AG (1973) Deep impurities in semiconductors. Wiley, New York

2. Stoneham AM (1975) Theory of defects in solids. Oxford University Press, Oxford

3. Landsberg PT (1991) Recombination in semiconductors. Cambridge University Press, Cambridge

4. Sah CT, Forbes L, Rosier I, Tasch Jr AF (1970) Solid State Electron 13:759

5. Grimmeiss HG, Kleverman M (1992) Adv Mater 4:261

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