Applications of Secondary Ion Mass Spectrometry (SIMS)-Reference-Cited by-同舟云学术

Applications of Secondary Ion Mass Spectrometry (SIMS)

Published:1977 Issue: Volume: Page:63-83
ISSN:0076-8642
Container-title:Achtes Kolloquium über Metallkundliche Analyse mit Besonderer Berücksichtigung der Elektronenstrahl- und Ionenstrahl-Mikroanalyse Wien, 27. bis 29. Oktober 1976
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Author:

Werner H. W.

Publisher

Springer Vienna

Link

http://link.springer.com/content/pdf/10.1007/978-3-7091-3724-6_4

Reference61 articles.

1. C. A. Andersen and J. R. Hinthorne, Analyt. Chemistry 45, 1421 (1973).

2. A. E. Morgan and H. W. Werner, Analyt. Chemistry 48, 699 (1976).

3. C. A. Andersen, H. J. Roden, and C. F. Robinson, J. Appl. Phys. 40, 3419 (1969).

4. H. W. Werner and A. E. Morgan, J. Appl. Phys. 47, 1232 (1976).

5. H. A. Storms, K. F. Brown, and J. D. Stein, paper presented at Japan-US joint seminar on Quantitative Techniques in SIMS; Honolulu, Hawaii, U. S. A., October 1975.

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