Charging of insulators by ion bombardment and its minimization for secondary ion mass spectrometry (SIMS) measurements
Author:
Affiliation:
1. Philips Research Laboratories, Eindhoven, The Netherlands
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Reference22 articles.
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3. Y. Ueda and J. Okano, Mass Spectrosc. 20, 185 (1972).
4. I. A. Abroyan, V. P. Lavrov, and I. G. Fedorova, Sov. Phys.‐Solid State 7, 2954 (1966).SPSSA70038-5654
5. F. M. Devienne, Le Vide 28, 193 (1973).
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