1. P. Dollfus, C. Bru, and P. Hesto, J.Appl.Phys., vol.73, p.804, 1993
2. L. Rajaonarison, P. Hesto, J.F. Pône, and P. Dollfus, Sisdep 91, vol.4, p.513, 1991
3. H. Sheng, R. Guerrieri, and A. Sangiovanni-Vincentelli Sisdep 91, vol.4, p.285, 1991
4. H.C. Chan, and T.J. Shieh, IEEE Trans. Electron Devices, vol.38,p.2427, 1993
5. H. Matsuo, J. Tanaka, A. Mishima, K. Tago, and T. Toyabe SISDEP 91, vol.4, p.165, 1991