1. H.J. Queisser, Mater. Res. Soc. Symp. Proc. 378 (1995) 3.
2. S.M. Sze, Semiconductor Devices (Wiley, New York, 1985).
3. R.A. Stradling and P.C. Klipstein, eds.,Growth and Characterisation of Semiconductors (Hilger, Bristol, 1990).
4. L.C. Feldman and J.W. Mayer, eds.,Fundamentals of Surface and Thin Film Analysis (North-Holland, Amsterdam, 1986).
5. J.-M. Spaeth, J.R. Niklas and R.H. Bartram,Structural Analysis of Point Defects in Solids, Solid-State Sciences 43 (Springer, Berlin, 1992).