Ion scattering spectroscopy and scanning tunneling microscopy: A powerful combination for surface structure analysis-Reference-Cited by-同舟云学术

Ion scattering spectroscopy and scanning tunneling microscopy: A powerful combination for surface structure analysis

Published:1991-11 Issue:5 Volume:53 Page:388-402
ISSN:0721-7250
Container-title:Applied Physics A Solids and Surfaces
language:en
Short-container-title:Appl. Phys. A

Author:

Niehus H.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry,Physics and Astronomy (miscellaneous),General Engineering,General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF00348151.pdf

Reference59 articles.

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2. Proc. Second Int. Conf. on STM, J. Vac. Sci. Technol. A 6 (1988), see also, Proc. Third Int. Conf. on STM, J. Microscopy 152 (1988) and also Proc. Fourth Int. Conf. on STM, J. Vac. Sci. Technol. A 8 (1990)

3. NATO ASI SERIES E: Applied Science,1990

4. For recent review articles see E. Taglauer: In Methods of Surface Characterization, Vol. 2. ed. by A.W. Czanderna, D.M. Hercules (Plenum, New York 1991)

5. H. Niehus: In Practical Surface Analysis by Ion and Neutral Spectroscopy, Vol. 2 (Wiley, Chichester 1991)

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