Heavy-ion and pulsed-laser single event effects in 130-nm CMOS-based thin/thick gate oxide anti-fuse PROMs-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Heavy-ion and pulsed-laser single event effects in 130-nm CMOS-based thin/thick gate oxide anti-fuse PROMs

Published:2019-04-13 Issue:5 Volume:30 Page:
ISSN:1001-8042
Container-title:Nuclear Science and Techniques
language:en
Short-container-title:NUCL SCI TECH

Author:

Cai Chang,Liu Tian-Qi,Li Xiao-Yuan,Liu Jie,Zhang Zhan-Gang,Geng Chao,Zhao Pei-Xiong,Li Dong-Qing,Ye Bing,Ji Qing-Gang,Mo Li-Hua

Publisher

Springer Science and Business Media LLC

Subject

Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://link.springer.com/content/pdf/10.1007/s41365-019-0602-6.pdf

Reference23 articles.

1. S.M. Guertin, G.M. Swift, D. Nguyen, Single-event upset test results for the Xilinx XQ1701L PROM, in Radiation Effects Data Workshop (REDW), 1999 IEEE (1999), pp. 35–40. https://doi.org/10.1109/redw.1999.816054

2. J. George, G. Swift, S. Guertin et al., Heavy ion SEE testing of Xilinx One-time programmable configuration PROMs, in Radiation Effects Data Workshop (REDW), 2004 IEEE (2004), pp. 72–78. https://doi.org/10.1109/redw.2004.1352908

3. C.P. Han, L. Zhang, Y.P. Zou et al., Design and implementation of high reliable spaceborne reconfiguration system, in International Conference on Electronics Information and Emergency Communication (ICEIEC), 2016 IEEE (2016), pp. 273–277. https://doi.org/10.1109/iceiec.2016.7589737

4. S. Chiang, R. Wang, J. Chen, et al., Oxide-Nitride-Oxide antifuse reliability, in International Reliability Physics Symposium 28th Annual Proceedings(IRPS), 1990 IEEE (1990) pp. 186–192. https://doi.org/10.1109/relphy.1990.66084

5. O. Kim, C.J. Oh, K.S. Kim, CMOS trimming circuit based on polysilicon fusing. Electron. Lett. 34, 355–356 (1998). https://doi.org/10.1049/el:19980320

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Pulsed Laser Single Event Effect on Deep Neural Network of Xilinx Ultrascale+ MPSoC;IEEE Transactions on Nuclear Science;2024-05

2. Prototype of single-event effect localization system with CMOS pixel sensor;Nuclear Science and Techniques;2022-11

3. Operando HERFD-XANES and surface sensitive Δμ analyses identify the structural evolution of copper(II) phthalocyanine for electroreduction of CO2;Journal of Energy Chemistry;2022-01

4. Verification of SEU resistance in 65 nm high-performance SRAM with dual DICE interleaving and EDAC mitigation strategies;Nuclear Science and Techniques;2021-12

5. Single-event-effect propagation investigation on nanoscale system on chip by applying heavy-ion microbeam and event tree analysis;Nuclear Science and Techniques;2021-10

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3