Enhancement of System-Lifetime by Alternating Module Activation
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Publisher
Springer Berlin Heidelberg
Link
http://link.springer.com/content/pdf/10.1007/978-3-642-38853-8_8
Reference18 articles.
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3. Mitra, S., Seifert, N., Zhang, M., Shi, Q., Kim, K.S.: Robust System Design with Built-In Soft-Error Resilience. Computer 38(2), 43–52 (2005)
4. Inukai, T., Hiramoto, T., Sakurai, T.: Variable threshold CMOS (VTCMOS) in series connected circuits. In: Proceedings of the International Symposium on Low Power Electronics and Design, pp. 201–206 (2001)
5. Tschanz, J., et al.: Adaptive body bias for reducing impacts of die-to-die and within-die parameter variations on microprocessor frequency and leakage. IEEE Journal of Solid-States Circuits 37, 1396–1402 (2002)
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