Instrumental Aspects of Spatially 3-Dimensional SIMS Analysis-Reference-Cited by-同舟云学术

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Instrumental Aspects of Spatially 3-Dimensional SIMS Analysis

Published:1982 Issue: Volume: Page:2-21
ISSN:0172-6218
Container-title:Secondary Ion Mass Spectrometry SIMS III
language:
Short-container-title:

Author:

Rüdenauer F. G.

Publisher

Springer Berlin Heidelberg

Link

http://link.springer.com/content/pdf/10.1007/978-3-642-88152-7_1.pdf

Reference32 articles.

1. G. Slodzian, Nat. Bur. Stand. U.S. Spec. Publ. 427 (1975)

2. H. Liebl, in Low Energy Ion Beams 1977, K.G. Stephens et al., eds. Conf. Ser. 38, The Inst. of Phys. (1978)

3. F.G. Rüdenauer, Int. J. Mass Spectrom. Ion Phys. 6, 309 (1971)

4. G. Slodzian, in Applied-Charged Particle Optics, A. Septier, ed., Academic Press (1980)

5. S. Taya, PhD Thesis, Osaka Univ., Japan (March 1978)

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. In situ ion implantation for quantification in secondary-ion mass spectrometry;Fresenius' Zeitschrift für analytische Chemie;1989-01

2. Practical surface analysis: state of the art and recent developments in AES, XPS, ISS and SIMS;Surface and Interface Analysis;1986-07

3. Applications and Limitations of Sims;Examining the Submicron World;1986

4. A microcomputer based digital imaging system for ion microanalysis;Journal of Microscopy;1985-04

5. Application of a liquid metal ion source to secondary ion mass spectrometry;Fresenius' Zeitschrift f�r Analytische Chemie;1984-06

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