Applications and Limitations of Sims
Reference18 articles.
1. H.F. Winters. “Physical Sputtering: A Discussion of Experiment and Theory”, in “Radiation Effects on Solid Surfaces” M. Kaminsky, ed. American Chemical Society, Washington, D.C. (1976), p. 1.
2. J.D. Brown, M.J. Higatsberger, F.G. Rüdenauer and W. Steiger. “Comparison of Oxygen and Indium Primary Ion Beams for SIMS Depth Profiling” in “Secondary Ion Mass Spectrometry, SIMS IV” A. Benninghoven et al., eds. Springer Verlag, Berlin (1984), p. 302.
3. J.B. Metson, G.M. Bancroft, H.W. Nesbitt and N.S. Mclntyre. “Molecular Ion Suppression in the Secondary Ion Mass Spectra of Minerals” in “Secondary Ion Mass Spectrometry, SIMS IV” A. Benninghoven et al., eds. Springer Verlag, Berlin (1984),p. 466.
4. Appl. Phys;A Benninghoven,1976
5. D.E. Harrison, Jr., W.A. Mason and R.P. Webb. “Molecular Dynamics Computer Simulation Study of the Damage Produced in Metal Target Surfaces During Ion Bombardment” in “Secondary Ion Mass Spectrometry, SIMS IV” A. Benninghoven et al., eds. Springer Verlag, Berlin (1984), p. 24.