Author:
Huang Jiao-ying,Gao Cheng,Cui Wei,Mei Liang
Publisher
Springer Science and Business Media LLC
Subject
Metals and Alloys,General Engineering
Reference22 articles.
1. FREEMAN Y, HAHN R, LESSNER P. Reliability and critical applications of tantalum capacitors [C]// CARTS Europe. Barcelona, Spain, 2007: 194–203.
2. SOTIRIS V A, TSE P W, PECHT M G. Anomaly detection through a bayesian support vector machine [J]. IEEE Transactions on Reliability, 2010, 59(2): 277–286.
3. PARK Jong-in, BAE Suk-joo. Direct prediction methods on lifetime distribution of organic light-emitting diodes from accelerated degradation tests [J]. IEEE Transactions on Reliability, 2010, 59(1): 74–90.
4. LU C J, MEEKER W Q. Using degradation measures to estimate a time-to-failure distribution [J]. Techno Metrics, 1993, 35(2): 161–174.
5. LISTA V, GARBOSSA P, TOMASI T. Degradation based long-term reliability assessment for electronic components in submarine applications [J]. Micro-electronics Reliability, 2002, 42: 1389–1392.
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献