Scattering loss in optical waveguide with trapezoidal cross section
Author:
Publisher
Springer Science and Business Media LLC
Subject
Metals and Alloys,General Engineering
Link
http://link.springer.com/content/pdf/10.1007/s11771-012-1144-9.pdf
Reference16 articles.
1. LEE K K, LIM D R, LUAN H C, AGARWAL A, FORESI J, KIMERLING L C. Effect of size and roughness on light transmission in a Si/SiO2 waveguide: Experiment and model [J]. Applied Physics Letters, 2000, 77(1): 1617–1619.
2. KUAN P Y, ANDRÉ D, JEAN L, BORIS L, JENS H S, PHILIP W, BARRY A S, SIEGFRIED J. Correlation of scattering loss, sidewall roughness and waveguide width in silicon-on-insulator (SOI) ridge waveguides [J]. Journal of Lightwave Technology, 2009, 27(8): 3999–4008.
3. BARWICZ T, HAUS H A. Three-dimensional analysis of scattering losses due to sidewall roughness in microphotonic waveguides [J]. Journal of Lightwave Technology, 2005, 23(9): 2719–2732.
4. GRILLOT F, VIVIEN L, LAVAL S, PASCAL D, CASSAN E. Size influence on the propagation loss induced by sidewall roughness in ultrasmall SOI waveguides [J]. IEEE Photonics Technology Letters, 2004, 16(7): 1661–1663.
5. KEHINDE O L D, FRANK P P. Impact of waveguide sidewall roughness on the output uniformity and phase of MMI splitters [J]. Opt Quant Electron, 2008, 40: 863–873.
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1. Modeling and simulation of the effect of surface roughness on properties of silicon-on-insulator optical ring resonator coupled with a straight waveguide;Optical Engineering;2015-12-07
2. Isogeometric analysis for elliptical waveguide eigenvalue problems;Journal of Central South University;2013-01
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