Structural investigations of Ge nanoparticles embedded in an amorphous SiO2 matrix-Reference-Cited by-同舟云学术

Structural investigations of Ge nanoparticles embedded in an amorphous SiO2 matrix

Published:2010-07-18 Issue:1 Volume:13 Page:221-232
ISSN:1388-0764
Container-title:Journal of Nanoparticle Research
language:en
Short-container-title:J Nanopart Res

Author:

Stavarache Ionel,Lepadatu Ana-Maria,Gheorghe Nicoleta G.,Costescu Ruxandra M.,Stan George E.,Marcov Dan,Slav Adrian,Iordache Gheorghe,Stoica Tionica F.,Iancu Vladimir,Teodorescu Valentin S.,Teodorescu Cristian M.,Ciurea Magdalena Lidia

Publisher

Springer Science and Business Media LLC

Subject

Condensed Matter Physics,General Materials Science,Modelling and Simulation,General Chemistry,Atomic and Molecular Physics, and Optics,Bioengineering

Link

http://link.springer.com/content/pdf/10.1007/s11051-010-0021-4.pdf

Reference52 articles.

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3. Basa P, Alagoz AS, Lohner T, Kulakci M, Turan R, Nagy K, Horváth ZsJ (2008) Electrical and ellipsometry study of sputtered SiO2 structures with embedded Ge nanocrystals. Appl Surf Sci 254:3626–3629. doi: 10.1016/j.apsusc.2007.10.075

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