Investigation of heavy ion radiation and temperature on junctionless tunnel field effect transistor

Author:

Aishwarya K.,Lakshmi B.

Publisher

Springer Science and Business Media LLC

Subject

Condensed Matter Physics,General Materials Science,Modeling and Simulation,General Chemistry,Atomic and Molecular Physics, and Optics,Bioengineering

Reference50 articles.

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2. Flakus FN (1982) Detecting and measuring ionizing radiation- a short history. IAEA Bull 23(4):31–36

3. Jihyun K, Pearton SJ, Chaker F, Jiancheng Y, Fan R, Suhyun K, Polyakov AY (2019) Radiation damage effects in Ga2O3 materials and devices. J Mater Chem C 7(1):10–24. https://doi.org/10.1039/c8tc04193h

4. Schwank JR, Shaneyfelt MR, Dodd PE (2013) Radiation hardness assurance testing of microelectronic devices and integrated circuits: radiation environments, physical mechanisms, and foundations for hardness assurance. IEEE Trans Nucl Sci 60(3):2074–2100. https://doi.org/10.1109/TNS.2013.2254722

5. Arshak K, Korostynska O (2006) Response of metal oxide thin film structures to radiation. Mater Sci Eng B 133:1–7. https://doi.org/10.1016/j.mseb.2006.06.012

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