1. IEEE Standard 1149.1-1990, ?Test access port and boundary scan architecture,? Available from the IEEE Inc., 345 East 45th Street, New York, NY 10017-2394, USA; Price: $49.00 (member price $24.50).
2. G.D. Robinson, ?Boundary scan impact on board test strategies,? Proc. Electro., May 1990, pp. 1?8.
3. S. Evanczuk, ?IEEE 1149.1: a designer's reference,? High Performance Systems, August 1989, pp. 52?60.
4. C.M. Maunder and R.E. Tulloss, ?The test access port and boundary scan architecture: Tutorial of IEEE 1149.1 and its applications,? IEEE Computer Society Press, 1990.
5. K. Parker, ?The impact of boundary scan on board test,? IEEE Design and Test of Computers, August 1989, pp. 18?31.