Sensitivity analysis in economics based test strategy planning-Reference-Cited by-同舟云学术

Sensitivity analysis in economics based test strategy planning

Published:1994 Issue:2-3 Volume:5 Page:239-251
ISSN:0923-8174
Container-title:Journal of Electronic Testing
language:en
Short-container-title:J Electron Test

Author:

Dick J. H.,Trischler E.,Dislis C.,Ambler A. P.

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering

Link

http://link.springer.com/content/pdf/10.1007/BF00972083.pdf

Reference14 articles.

1. C. Dislis, I.D. Dear, J.R. Miles, S.C. Lau and A.P. Ambler, ?Cost Analysis of Test Method Environments,? IEEE International Test Conference, pp. 875?883, 1989.

2. I.D. Dear, C. Dislis, A.P. Ambler, J. Dick, ?Economic Effects in Design and Test,?IEEE Design and Test of Computers, vol. 8, no. 4, pp. 64?77, Dec. 1991.

3. M.S. Abadir, ?TIGER: Testability Insertion Guidance Expert System,?Proceedings IEEE International Conference on Computer Aided Design, pp. 562?565, 1989.

4. M.A. Myers, ?An Analysis of the Cost and Quality Impact of LSI/VLSI Technology on PCB Test Strategies,? IEEE International Test Conference, 1983, pp. 382?395.

5. S.A. Szygenda, ?Profit, Liability, and Education: Influencing Factors on the Economics of Non-testing,?Proc. Economics of Design and Test for Electronic Circuits and Systems, Ellis Horwood Limited, Chichester, 1992.

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