Author:
Tyagi A K,Nair K G M,Krishan K
Publisher
Springer Science and Business Media LLC
Subject
Mechanics of Materials,General Materials Science
Cited by
3 articles.
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1. SIMS as a new methodology to depth profile helium in as-implanted and annealed pure bcc metals?;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2017-05
2. Quantitative analysis of helium by post-ionization method using femtosecond laser technique;Surface and Interface Analysis;2016-08-11
3. SIMS depth profiling of implanted helium in pure iron using CsHe+ detection mode;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2013-01