Author:
Brzozowski J. A.,Jürgensen H.
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Reference19 articles.
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5. B.F. Cockburn and J.A. Brzozowski, “Near-Optimal Tests for Classes of Write-Triggered Coupling Faults in RAMs,”J. of Electronic Testing: Theory and Applications, Vol. 3, pp. 251–264, August 1992.
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