An Advanced Image Processing Technique for Backscatter-Electron Data by Scanning Electron Microscopy for Microscale Rock Exploration
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Publisher
Springer Science and Business Media LLC
Link
https://link.springer.com/content/pdf/10.1007/s12583-024-1969-9.pdf
Reference24 articles.
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5. De Boever, W., Derluyn, H., Van Loo, D., et al., 2015. Data-Fusion of High Resolution X-Ray CT, SEM and EDS for 3D and Pseudo-3D Chemical and Structural Characterization of Sandstone. Micron, 74: 15–21. https://doi.org/10.1016/j.micron.2015.04.003
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