Importance sampling of products from illumination and BRDF using spherical radial basis functions

Author:

Tsai Yu-Ting,Chang Chin-Chen,Jiang Qing-Zhen,Weng Shr-Ching

Publisher

Springer Science and Business Media LLC

Subject

Computer Graphics and Computer-Aided Design,Computer Vision and Pattern Recognition,Software

Reference32 articles.

1. Agarwal, S., Ramamoorthi, R., Belongie, S., Jensen, H.W.: Structured importance sampling of environment maps. ACM Trans. Graph. 22(3), 605–612 (2003)

2. Burke, D., Ghosh, A., Heidrich, W.: Bidirectional importance sampling for direct illumination. In: Proceedings of Eurographics Symposium on Rendering, pp. 147–156. Eurographics Association, Konstanz (2005)

3. Clarberg, P., Jarosz, W., Akenine-Möller, T., Jenson, H.W.: Wavelet importance sampling: efficiently evaluating products of complex functions. ACM Trans. Graph. 24(3), 1166–1175 (2005)

4. Claustres, L., Paulin, M., Boucher, Y.: BRDF measurement modeling using wavelets for efficient path tracing. Comput. Graph. Forum 22(4), 701–716 (2003)

5. Cline, D., Egbert, P.K., Talbot, J.F., Cardon, D.L.: Two stage importance sampling for direct lighting. In: Proceedings of Eurographics Symposium on Rendering, pp. 103–113. Eurographics Association, Nicosia, Cyprus (2006)

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