Single stuck-at-faults detection using test generation vector and deep stacked-sparse-autoencoder-Reference-Cited by-同舟云学术

Single stuck-at-faults detection using test generation vector and deep stacked-sparse-autoencoder

Published:2020-09-22 Issue:10 Volume:2 Page:
ISSN:2523-3963
Container-title:SN Applied Sciences
language:en
Short-container-title:SN Appl. Sci.

Author:

Malihi Leila,Malihi Razieh

Funder

Shahid Chamran University of Ahvaz

Publisher

Springer Science and Business Media LLC

Subject

General Earth and Planetary Sciences,General Physics and Astronomy,General Engineering,General Environmental Science,General Materials Science,General Chemical Engineering

Link

https://link.springer.com/content/pdf/10.1007/s42452-020-03460-0.pdf

Reference31 articles.

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3. Roth JP et al (1968) Diagnosis of automata failures. IBM J Res Dev 10(4):278–291

4. Goel P (1981) An implicit enumeration algorithm to generate tests for combinational logic circuits. IEEE Trans Comput C-30(3):215–222

5. Fujiwara H, Shimono T (1983) On the acceleration of test generation algorithms. IEEE Trans Comput C-32(12):1137–1144

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