Quantitative Electron Probe Microanalysis of Ultra-Light Elements (Boron-Oxygen)-Reference-Cited by-同舟云学术

Quantitative Electron Probe Microanalysis of Ultra-Light Elements (Boron-Oxygen)

Published:1991 Issue: Volume: Page:145-161
ISSN:
Container-title:Electron Probe Quantitation
language:
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Author:

Bastin G. F.,Heijligers H. J. M.

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4899-2617-3_8

Reference15 articles.

1. Bastin, G. F. and Heijligers, H. J. M. (1986), X-Ray Spectr. 15, 135–150.

2. Bastin, G. F. and Heijligers, H. J. M. (March 1984), Quantitative Electron Probe Microanalysis of Carbon in Binary Carbides, Internal Report, Eindhoven University of Technology.

3. Bastin, G. F. and Heijligers, H. J. M. (1984), Microbeam Analysis, Romig, A. D., Jr. and Goldstein, J. I., eds., 291.

4. Bastin, G. F. and Heijligers, H. J. M. (March 1986), Quantitative Electron Probe Microanalysis of Boron in Binary Borides, Internal Report, Eindhoven University of Technology.

5. Bastin, G. F. and Heijligers, H. J. M. (1986), J. Microsc. Spectrosc. Electron. 11, 215–228.

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