1. Adler, I., X-Ray Emission Spectrography in Geology, Elsevier, Amsterdam (1966); Chap. 4, pp. 43–60.
2. Bertin, E. P., Principles and Practice of X-Ray Spectrometric Analysis, 2nd ed., Plenum Press, New York (1975); Chaps. 6 and 7, pp. 219–314.
3. Birks, L. S., X-Ray Spectrochemical Analysis, 2nd ed., Interscience, New York (1969); Chap. 5, pp. 43–55.
4. Bowman, H. R., E. K. Hyde, S. G. Thompson, and R. C. Jared, “Application of High-Resolution Semiconductor Detectors in X-Ray Emission Spectrography,” Science, 151, 562–568 (1966).
5. Dowling, P. H., C. F. Hendee, T. R. Kohler, and W. Parrish, “Counters for X-Ray Analysis,” Philips Tech. Rev.
18, 262–275 (1956-57); Norelco Rep.
4, 23-33 (1957).