Extensive Analysis of Gate Leakage Current in Nano-Scale Multi-gate MOSFETs

Author:

Yadav Shekhar,Kumar Hemant,Negi Chandra Mohan SinghORCID

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Reference55 articles.

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2. N.S. Kim, T. Austin, D. Blaauw, T. Mudge, K. Flautner, J.S. Hu, M. Jane Irwin, M. Kandemir, V. Narayanan, in Computer (Long. Beach. Calif) (2003), p. 36

3. J. Tonfat, G. Flach, R. Reis, in Proceesings of the 2016 26th International Workshop on Power and Timing Modeling, Optimization and Simulation, PATMOS 2016 (2017), pp. 107

4. A. Goel, S. Rewari, S. Verma, R.S. Gupta, in IEEE 16th India Council International Conference, INDICON 2019−Symposium Proceedings 2019(2019)

5. A.K. Rana, N. Chand, V. Kapoor, J. Comput. Electron. 10, 222 (2011)

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