Integration of Testing Effort Function into Delayed S-Shaped Software Reliability Growth Model with Imperfect Debugging — a Proposed Bokhari Model

Author:

Bokhari Mohammad Ubaidullah,Siddiqui Md. Ashraf,Ahmad AfaqORCID

Publisher

Springer Science and Business Media LLC

Reference32 articles.

1. Ahmad A (2019) Reliable and fault tolerant systems on chip through design for testability, a Keynote Speech in the IEEE Conference: 2019 Amity International Conference on Artificial Intelligence – (AICAI’19), held at Amity University, Int’l Academic City, Dubai, UAE, Feb. 4–7, 50–53. IEEE Xplore. https://doi.org/10.1109/AICAI.2019.8701390

2. Ahmad A (2017) Challenges for test and fault-tolerance due to convergence of electronics, semiconductor systems and computing, a Keynote Speech in the IEEE Conference: 2017 International Conference on Infocom Technologies and Unmanned Systems (Trends and Future Directions) (ICTUS), held at Amity University, Int’l Academic City, Dubai, UAE, 18–20 Dec. 2017. 64–68. IEEE Xplore. https://doi.org/10.1109/ICTUS.2017.8285961

3. Ahmad A, Al-Abri D, Bait-Shiginah F (2013) Software testing education—a required knowledge for software systems’ developers and managers, Free and Open Source Software Conference” (FOSSC-13), held at Muscat, Oman, February 18–19, 2013. 29–33. https://fossc.om/images/papers/AfaqAhmadFosscOman2013pdf

4. Ahmad N, Bokhari MU, Quadri SMK, Khan MGM (2008) The exponentiated Weibull software reliability growth model with various testing-efforts and optimal release policy: a performance analysis. Intern J Quality Reliab Manag 25(2):211–235

5. Bokhari MU, Ahmad N (2014) Incorporating Burr Type XII testing-efforts into software reliability growth modelling and actual data analysis with applications. J Software 9(6):1389–1400

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