Automatic inspection system of LED chip using two-stages back-propagation neural network-Reference-Cited by-同舟云学术

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Automatic inspection system of LED chip using two-stages back-propagation neural network

Published:2013-01-04 Issue:6 Volume:25 Page:1235-1243
ISSN:0956-5515
Container-title:Journal of Intelligent Manufacturing
language:en
Short-container-title:J Intell Manuf

Author:

Kuo Chung-Feng Jeffrey,Hsu Chien-Tung Max,Liu Zong-Xian,Wu Han-Cheng

Publisher

Springer Science and Business Media LLC

Subject

Artificial Intelligence,Industrial and Manufacturing Engineering,Software

Link

http://link.springer.com/content/pdf/10.1007/s10845-012-0725-7.pdf

Reference24 articles.

1. Balfour, C., Smith, J. S., & Amin-Nejad, S. (2004). Feature correlation for weld image-processing applications. International Journal of Production Research, 42(5), 975–995.

2. Chang, C. Y., Chang, C. H., Li, C. H. & Jeng, M. D., (2007). Learning vector quantization neural networks for LED wafer defect inspection. IEEE Digital Object Identifier, 230–230.

3. Chiu, H. J., & Cheng, S. J. (2007). LED backlight driving system for large-scale LCD panels. IEEE Transactions on Industrial Electronics, 54(5), 2751–2760.

4. Chiu, H. J., Lo, Y. K., Chen, J. T., Cheng, S. J., Lin, C. Y., & Mou, S. C. (2010). A high-efficiency dimmable LED driver for low-power lighting applications. IEEE Transactions on Industrial Electronics, 57(2), 735–743.

5. Chung, K. L., & Chen, W. Y. (2003). Fast adaptive PNN-based thresholding algorithms. Pattern Recognition, 36(12), 2793–2804.

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