Long-Tailed Defects Classification Based on Probabilistic Aggregation Network for Light-Emitting Diode Packaging Process-Reference-Cited by-同舟云学术

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Long-Tailed Defects Classification Based on Probabilistic Aggregation Network for Light-Emitting Diode Packaging Process

Published:2024 Issue: Volume: Page:1-11
ISSN:1551-3203
Container-title:IEEE Transactions on Industrial Informatics
language:
Short-container-title:IEEE Trans. Ind. Inf.

Author:

Chen Jiajun¹^ORCID,Yin Hongpeng¹^ORCID,Qin Yan¹^ORCID,Jiang Weijie¹^ORCID

Affiliation:

1. School of Automation, Chongqing University, Chongqing, China

Funder

National Natural Science Foundation of China

Natural Science Foundation of Chongqing

Chongqing Talents: Exceptional Young Talents

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx8/9424/4389054/10579070.pdf?arnumber=10579070

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