Bulk Crystal Growth, and High-Resolution X-ray Diffraction Results of LiZnAs Semiconductor Material-Reference-Cited by-同舟云学术

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Bulk Crystal Growth, and High-Resolution X-ray Diffraction Results of LiZnAs Semiconductor Material

Published:2017-04-06 Issue:8 Volume:46 Page:4875-4882
ISSN:0361-5235
Container-title:Journal of Electronic Materials
language:en
Short-container-title:Journal of Elec Materi

Author:

Montag Benjamin W.,Reichenberger Michael A.,Sunder Madhana,Ugorowski Philip B.,Nelson Kyle A.,Henson Luke C.,McGregor Douglas S.

Funder

DOE – NNSA

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/article/10.1007/s11664-017-5471-3/fulltext.html

Reference34 articles.

1. B.W. Montag, M.A. Reichenberger, K.R. Arpin, M. Sunder, K.A. Nelson, P.B. Ugorowski, and D.S. McGregor, J. Cryst. Growth 412, 103 (2015).

2. B.W. Montag, M.A. Reichenberger, P.B. Ugorowski, M. Sunder, J. Weeks, and D.S. McGregor, J. Cryst. Growth 438, 99 (2016).

3. R. Juza, K. Langer, and K. Von Benda, Angew. Chem. Int. Edit. 7, 360 (1968).

4. H. Nowotny and K. Bachmayer, Monatsh. Chem. 81, 488 (1950).

5. D. Kieven, A. Grimm, A. Beleanu, C.G.F. Blum, J. Schmidt, T. Rissom, I. Lauermann, T. Gruhn, C. Felser, and R. Klenk, Thin Solid Films 519, 1866 (2011).

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