Impact of critical processes on HgCdTe diode performance and yield-Reference-Cited by-同舟云学术

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Impact of critical processes on HgCdTe diode performance and yield

Published:2003-07 Issue:7 Volume:32 Page:588-591
ISSN:0361-5235
Container-title:Journal of Electronic Materials
language:en
Short-container-title:Journal of Elec Materi

Author:

Figgemeier Heinrich,Bruder Martin,Mahlein Karl-Martin,Wollrab Richard,Ziegler Johann

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/s11664-003-0037-y.pdf

Reference3 articles.

1. M. Bruder, H. Figgemeier, L. Palm, J. Ziegler, and H. Maier, SPIE Conf. 2554 (1995), p. 137.

2. R.S. List, J. Electron. Mater. 22 (1993), p. 1017.

3. S.M. Johnson, D.R. Rhiger, J.P. Rosbeck, J.M. Peterson, S.M. Taylor, and M.E. Boyd, J. Vac. Sci. Technol. B 10 (1992).

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