Quantifying the Rates of Sn Whisker Growth and Plastic Strain Relaxation Using Thermally-Induced Stress

Author:

Pei Fei,Bower Allan F.,Chason Eric

Funder

NSF-DMR

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference58 articles.

1. NHTSA–NASA Study of Unintended Acceleration in Toyota Vehicle, in: National Highway Traffic Safety Administration (NHTSA), 2011, p. 121.

2. NASA. Multiple examples of whisker-induced failures are documented on the NASA website. Available: http://nepp. nasa.gov/whisker/ .

3. Directive 2002/95/Ec of the European Parliament and of the council of 27 January 2003 on the restriction of the use of certain hazardous substances in electrical and electronic equipment., E. Union, 2003.

4. G.T. Galyon and I.E.E.E. Trans, Electron. Packag. Manuf. 28, 94 (2005).

5. E. Chason, N. Jadhav, F. Pei, E. Buchovecky, and A. Bower, Prog. Surf. Sci. 88, 103 (2013).

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