1. J. Watson, High-temperature electronics pose design and reliability challenges (Analog Dialogue, April 2012), http://www.analog.com/library/analogDialogue/ . Accessed 15 July 2013.
2. V. Chidambaram, H.B. Yeung, and G. Shan, J. Electron. Mater. 41, 8 (2012).
3. S.-H. Choa, J. Microsyst. Technol. (2005). doi: 10.1007/s00542-005-0603-8 .
4. W.C. Welch III and K. Najafi, Proceedings of the International Conference on MEMS (Tucson, United States, 2008), p. 806.
5. W. Zhang, A. Matin, E. Beyne, and W. Ruythooren, Proceedings of the Electronic Components and Technology Conference (Singapore, 2008), p. 1984.