Imaging of Metal Impurities in Silicon by Luminescence Spectroscopy and Synchrotron Techniques-Reference-Cited by-同舟云学术

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Imaging of Metal Impurities in Silicon by Luminescence Spectroscopy and Synchrotron Techniques

Published:2010-03-03 Issue:6 Volume:39 Page:787-793
ISSN:0361-5235
Container-title:Journal of Electronic Materials
language:en
Short-container-title:Journal of Elec Materi

Author:

Schubert Martin C.,Schön Jonas,Gundel Paul,Habenicht Holger,Kwapil Wolfram,Warta Wilhelm

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/s11664-010-1114-7.pdf

Reference27 articles.

1. O. Schultz (PhD, Universität Konstanz, 2005).

2. A.A. Istratov, T. Buonassisi, R.J. McDonald, A.R. Smith, R. Schindler, J.A. Rand, J.P. Kalejs, and E.R. Weber, J. Appl. Phys. 94, 6552 (2003).

3. T. Buonassisi, A.A. Istratov, S. Peters, C. Ballif, J. Isenberg, S. Riepe, W. Warta, R. Schindler, G. Willeke, Z. Cai, B. Lai, and E.R. Weber, Appl. Phys. Lett. 87, 121918 (2005).

4. T. Buonassisi, A.A. Istratov, M.D. Pickett, M. Heuer, J.P. Kalejs, G. Hahn, M.A. Marcus, B. Lai, Z. Cai, S.M. Heald, T.F. Ciszek, R.F. Clark, D.W. Cunningham, A.M. Gabor, R. Jonczyk, S. Narayanan, E. Sauar, and E.R. Weber, Prog. Photovolt. Res. Appl. 14, 513 (2006).

5. J. Tan, D. Macdonald, N. Bennett, D. Kong, A. Cuevas, and I. Romijn, Appl. Phys. Lett. 91, 043505 (2007). doi: 10.1063/1.2766664 .

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